By Topic

Calibration of a lens-focused reflectometer by means of a mixed time/frequency domain method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Fyiedsam, G.L. ; Lehrstuhl fur Hochfrequenztech., Tech. Univ. Munchen, Germany ; Biebl, E.M.

A lens-focused reflectometer operating in the 75-95 GHz frequency range for measuring the square of the complex transmission coefficient of planar samples for different angles of incidence and polarization states is presented. The systematic errors of the set-up are reduced by employing a new advanced time/frequency domain calibration method. Experimental results obtained with the lens-focused reflectometer and with a free-space transmission measurement system are in good agreement. The deviation in the magnitude and in the phase of the measured curves are less than 1.0% and 1.0/spl deg/, respectively.

Published in:

Microwave Symposium Digest, 1998 IEEE MTT-S International  (Volume:3 )

Date of Conference:

7-12 June 1998