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Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG

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3 Author(s)
M. S. Hsiao ; Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA ; E. M. Rudnick ; J. H. Patel

New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing sequences are used to propagate the fault effects from the flip-flops to the primary outputs by distinguishing the faulty machine state from the fault-free machine state. Set, clear, and pseudoregister justification sequences are used for state justification via a combination of partial state justification solutions. Reengineering of existing finite-state machine sequences may be needed for specific target faults. Moreover, conflicts imposed by the use of multiple sequences may need to be resolved. Genetic-algorithm-based techniques are used to perform these tasks. Very high fault coverages have been obtained as a result of this technique

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:17 ,  Issue: 3 )