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Bright-field Analysis Of Field-emission Cones Using High-resolution Transmission Electron Microscopy

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7 Author(s)
Goodhue, W.D. ; Massachusetts Institute of Technology ; Nitishin, P.M. ; Harris, C.T. ; Bozler, C.O.
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First Page of the Article

Published in:

Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International

Date of Conference:

12-15 Jul 1993