Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Optimal information-dispersal for increasing the reliability of a distributed service

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hung-Min Sun ; Dept. of Inf. Manage., Chaoyang Univ. of Technol., Taichung, Taiwan ; Shiuh-Pyng Shieh

This paper investigates the (m,n) information dispersal scheme (IDS) used to support fault-tolerant distributed servers in a distributed system. In an (m,n)-IDS, a file M is broken into n pieces such that any m pieces collected suffice for reconstructing M. The reliability of an (m,n)-IDS is primarily determined by 3 important factors: n=information dispersal degree (IDD), n/m=information expansion ratio (IER), Ps=success-probability of acquiring a correct piece. It is difficult to determine the optimal IDS with the highest reliability from very many choices. Our analysis shows: several novel features of (m,n)-IDS which can help reduce the complexity of finding the optimal IDS with the highest reliability; that an IDS with a higher IER might not have a higher reliability, even when Ps→1. Based on the theorems given herein, we have developed a method that reduces the complexity for computing the highest reliability from, O(ν) [ν=number of servers] to O(1) when the `upper bound of the IER'=1, or O(ν2) to O(1) when the `upper bound of the IER'>1

Published in:

Reliability, IEEE Transactions on  (Volume:46 ,  Issue: 4 )