Close category search window
 

Characterization of radar clutter by gamma induced distributions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Muller, H.J. ; Inst. fur Hochfrequenztechnik, Oberpfaffenhofen, Germany

In the weak scattering regime the statistical properties of terrain backscatter data observed with satellite and airborne synthetic aperture radars differ from Gaussian statistics the higher the resolution, the lower the looknumber and the stronger the texture are. The recently presented and discussed G-distribution is a most suitable candidate to cover up the wide range of homogeneous, heterogeneous and extremely heterogeneous radar clutter, which under limiting conditions converges to Gaussian. The G-distribution contains as particular cases the isotropic (=zero mean) KO-distribution and the GO-distribution, the last of which is able to model very heavy backscatter such as that of urban areas. In this paper are given reasons that the multilook G-distribution is based on three joint distributions from the Gamma family. The gamma-distributed complex speckle is conditionally multiplied with the gamma-distributed regular part of radar returns and the widely dispersed part of returns, which is inverse-gamma-distributed. The mixing of gamma and inverted gamma generates the generalized inverse Gaussian distribution. If the radar data are normalized the G-distribution is completely determined by the shape parameter α and the concentration parameter ω. Both parameters can be estimated by the method of moments in an unbiased way

Published in:
Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International  (Volume:3 )

Date of Conference: 6-10 Jul 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.