By Topic

Experimental results on reduced harmonic distortion in circuits with correlated double sampling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yunteng Huang ; Newport Microsyst. Inc., Irvine, CA, USA ; Temes, G.C. ; Ferguson, P.F., Jr

It is shown both by analysis and experiment that in a class of SC circuits using correlated double sampling (CDS), the harmonic distortion caused by nonlinear op-amps is greatly reduced. These circuits are very useful in applications such as input stages in high-linearity amplifiers or in delta-sigma converters, especially in a low-voltage technology.

Published in:

VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on

Date of Conference:

11-13 June 1998