By Topic

Analysis of shadow mask thermal deformation and prediction of beam landing shifts for color CRT

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kug Woon Kim ; Digital-Media Res. Lab., LG Electron. Inc., Seoul, South Korea ; Nam Woong Kim ; Dae-Jin Kang

In the cathode ray tube (CRT), beam landing shifts on the phosphor screen mainly result from the thermal deformation of the mask frame assembly and deteriorate the color purity. The thermal deformation of the mask frame assembly is analyzed by using the finite element method (FEM) and the beam landing shifts are predicted. For a realistic analysis, the apparent thermal conductivity and the apparent elastic modulus are calculated and the shadow mask is modeled as a shell without apertures. All the parts inside the CRT are modeled and the each radiative effect is considered. Then finite element analysis is performed for transient thermo-elastic deformation of the mask frame assembly and the beam landing shifts are calculated. Experiments are performed for a 17" CRT to validate the FEM analysis. The temperatures of all parts inside the CRT and the beam landing shift on the panel are measured and the results are discussed in comparison with the results of the FEM analysis. From the study, we show that this analysis method can be applicable for designing a mask frame assembly of a CRT that results in a landing shift of the order of a few micro-meters

Published in:

IEEE Transactions on Consumer Electronics  (Volume:44 ,  Issue: 2 )