Cart (Loading....) | Create Account
Close category search window
 

Maximally Flat Negative Group-Delay Circuit: A Microwave Transversal Filter Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wu, C.-T.M. ; Electr. Eng. Dept., Univ. of California at Los Angeles, Los Angeles, CA, USA ; Itoh, T.

A comprehensive method to synthesize negative group delay (NGD) in the microwave regime with a maximally flat response is proposed in this paper. This method is based on transversal-filter topologies; it will be shown that by choosing proper coupling coefficients of each tap of a transversal filter, we can realize NGDs with maximally flat characteristics at the output of the transversal filter. The desired coefficients to realize maximally flat NGDs with various amount of group delay are analytically derived and tabulated in this paper. Furthermore, the results are verified experimentally through microwave transversal-filter approaches in both passive and active ways using multi-section asymmetric directional couplers and distributed amplifiers.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:62 ,  Issue: 6 )

Date of Publication:

June 2014

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.