Cart (Loading....) | Create Account
Close category search window
 

Electromagnetically induced narrow linewidths of optical resonators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Muller, M. ; Inst. fur Atom- und Molekulphys., Hannover Univ., Germany ; Muller, G. ; Wicht, A. ; Rinkleff, R.-H.
more authors

Summary form only given. We present our work on the modified properties of an optical resonator that contains an electromagnetically induced transparency (EIT) medium. Transparency and steep index of refraction are utilized to reduce the linewidth of the cavity. The influence of the relative intensities of the laser fields is studied, and the results are in good agreement with computer simulations. The linewidth of an optical cavity depends on the phase shift accumulated by the light wave during one round trip. A transparent medium with very strong dispersion causes a very rapidly varying phase shift and would have a remarkable effect on the linewidth of the cavity.

Published in:

Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International

Date of Conference:

8-8 May 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.