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Extraction and Estimation of Pinned Photodiode Capacitance in CMOS Image Sensors

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6 Author(s)
Calvin Yi-Ping Chao ; Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan ; Yi-Che Chen ; Kuo-Yu Chou ; Jhy-Jyi Sze
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The pinned photodiode capacitance extraction method proposed by Goiffon et al. is discussed, and two additional new methods are presented and analyzed; one based on the full well dependence on photon flux and the other based on the full well dependence on transfer-gate off-voltage.

Published in:

IEEE Journal of the Electron Devices Society  (Volume:2 ,  Issue: 4 )