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Functional fault models for analog circuits

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1 Author(s)
Malyshenko, Yu.V. ; Vladivostok, Russia

For devices containing analog integrated circuits, the appropriate fault models are those that describe components at the functional level. Functional models proposed in the past have been too complicated for practical use. The models proposed here form the basis of simpler test selection techniques for analog ICs

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 2 )