By Topic

Control and observation structures for analog circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yeong-Ruey Sheh ; Nat. Tsing Hua Univ., Hsinchu, Taiwan ; Cheng-Wen Wu

No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. This paper provides an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 2 )