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The future: plug and pray?

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1 Author(s)
Maunder, Colin ; British Telecom Res. Labs., Ipswich, UK

In his keynote speech at the 1998 International Test Conference, held last November in Washington, D.C., the author presented a view of our increasing dependence on electronic systems and the impact this is likely to have on the way we design and test new products. Here, he summarizes his major points

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 2 )