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Test efficiency analysis of random self-test of sequential circuits

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2 Author(s)
Sastry, S. ; Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA ; Majumdar, A.

Motivated by the work of K. Kim et al. (1988) and A. Krasniewski and S. Pilarski (1989), the problem of test efficiency in random testing of sequential circuits using built-in self-test (BIST) techniques is addressed. It is shown that, given a circuit with n primary inputs and the goal of maximizing expected pattern coverage, different pattern-sampling distributions for its 2n possible patterns can be partially ordered. The exact distributions for pattern coverage for both equiprobable and nonequiprobable pattern-sampling distributions are derived. Approximations for pattern-coverage distributions under equiprobable pattern-sampling conditions and corresponding numerical results are presented. A limiting distribution function for pattern-coverage distribution is derived. The authors also present numerical results on confidence levels for obtaining a specified pattern coverage. The distribution for the number of test cycles (R) required to achieve a specified pattern coverage is also derived. The authors derive and use the expression for the expected value of R to illustrate the increase in the effect of achieving a specified coverage j as j increases

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:10 ,  Issue: 3 )