Cart (Loading....) | Create Account
Close category search window
 

Electron emission from geometrically complex thermionic cathodes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Lockwood, D.L. ; EG&G Optoelectron., Salem, MA, USA

Summary form only given. A simple method has been developed for analysis of the emission properties of geometrically complex cathodes. The technique is based on the assumption that current from a portion of the cathode surface is space charge limited with the balance being temperature limited. A model for total diode current was created that permits calculation of cathode properties from experimental data. An experiment was run in which the voltage on a charged capacitor was switched across a diode containing a complex finned cathode. Diode current and voltage were measured as a function of time with a high speed digitizer. These tests were repeated for a range of applied voltages and cathode temperatures. Current-vs-voltage data obtained from these measurements were fitted to the model using non-linear regression. The data were found to conform well to the model, showing that 64% of the cathode area was temperature limited at the maximum diode voltage.

Published in:

Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on

Date of Conference:

1-4 June 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.