Cart (Loading....) | Create Account
Close category search window
 

Ordinal measures for image correspondence

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bhat, D.N. ; LG Electron. Res. Center of America, Princeton, NJ, USA ; Nayar, S.K.

We present ordinal measures of association for image correspondence in the context of stereo. Linear correspondence measures like correlation and the sum of squared difference between intensity distributions are known to be fragile. Ordinal measures which are based on relative ordering of intensity values in windows-rank permutations-have demonstrable robustness. By using distance metrics between two rank permutations, ordinal measures are defined. These measures are independent of absolute intensity scale and invariant to monotone transformations of intensity values like gamma variation between images. We have developed simple algorithms for their efficient implementation. Experiments suggest the superiority of ordinal measures over existing techniques under nonideal conditions. These measures serve as a general tool for image matching that are applicable to other vision problems such as motion estimation and texture-based image retrieval

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:20 ,  Issue: 4 )

Date of Publication:

Apr 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.