Cart (Loading....) | Create Account
Close category search window

Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Heuermann, H. ; Inst. fur Hochfrequenztech., Ruhr-Univ., Bochum, Germany ; Schiek, B.

Exact calibration procedures to correct two-port measurements with leakage errors are developed for a network analyzer having three or four measurement channels. Many measurement systems including open air devices, such as MMIC wafer probes, contain numerous crosstalk paths which are included in the full models of the direct calibration procedures. These novel 15-term and 22-term procedures are based on closed solutions and need five and six successive measurements of completely known calibration standards. First, both procedures solve these general error models exactly. The reduction of the common 22-term model to a 10-term model describes a network analyzer with three measurement channels in a simple and common manner. In this way one may create a great number of new calibration procedures. The sensitivity and accuracy of a direct 15-term and a direct 22-term error correction procedure is demonstrated by experimental results

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:46 ,  Issue: 5 )

Date of Publication:

Oct 1997

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.