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Characterization of thin film microstrip lines on polyimide

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2 Author(s)
G. E. Ponchak ; NASA Lewis Res. Center, Cleveland, OH, USA ; A. N. Downey

This paper presents an in depth characterization of thin film microstrip (TFMS) lines fabricated on Dupont PI-2611 polyimide. Measured attenuation and effective dielectric constant is presented for TFMS lines with thicknesses from 2.45-7.4 μm and line widths from 5-34.4 μm over the frequency range of 1-110 GHz. The attenuation is separated into conductor and dielectric losses to determine the loss tangent of Dupont PI-2611 polyimide over the microwave frequency range. In addition, the measured characteristics are compared to closed form equations for α and εeff from the literature. Based on the comparisons, recommendations for the best closed form design equations for TFMS are made

Published in:

IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B  (Volume:21 ,  Issue: 2 )