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An Empirical Approach to Develop Near-Field Limit for Radiated-Emission Compliance Check

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8 Author(s)
Kye-Yak See ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Ning Fang ; Lin-Biao Wang ; Weishan Soh
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Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.

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Electromagnetic Compatibility, IEEE Transactions on  (Volume:56 ,  Issue: 3 )