Cart (Loading....) | Create Account
Close category search window

Optimizing basis function pole locations for transformer frequency response identification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wolinski, S. ; Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia ; Welsh, J.S. ; Tusek, J.

In this paper a technique for obtaining accurate parametric models of wideband frequency domain systems is applied to modeling the frequency response of power transformers. Obtaining accurate frequency response models is a problem for conventional identification techniques, and typically results in ill-conditioning due to the frequency range and numerous resonant modes of the transformer. `Frequency Localising Basis Functions' improve the conditioning of the estimator, and hence provide a more accurate fit. The location of these functions are optimized using Particle Swarm Optimization, and applied to frequency response data taken from a power transformer. A case study is undertaken on a 132kV, 60MVA power transformer.

Published in:

Power Engineering Conference (AUPEC), 2013 Australasian Universities

Date of Conference:

Sept. 29 2013-Oct. 3 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.