By Topic

Mathematical Modeling and Analysis of a Very Low Frequency HV Test System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Eberharter, S. ; Autom. & Control Inst., Vienna Univ. of Technol., Vienna, Austria ; Kemmetmuller, W. ; Kugi, A.

This paper presents a new type of very low frequency (VLF) high-voltage test system for on-site cable tests up to 200 kV rms. The VLF system is based on a so called differential resonance technology (DRT), which enables a light-weight and compact construction of cable test systems. A mathematical model of the test system is presented, which is used for a detailed analysis and optimization of the DRT system. Measurement results on a prototype for 200 kV rms and loads up to 0.75 μF are used to validate the mathematical model and to show the feasibility of the test system.

Published in:

Power Electronics, IEEE Transactions on  (Volume:29 ,  Issue: 11 )