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High resolution X-ray imaging using a silicon strip detector

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12 Author(s)
Beuville, E. ; Lawrence Berkeley Lab., CA, USA ; Cahn, R. ; Cederstrom, B. ; Danielsson, M.
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The authors present the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. The authors have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 μm pixel size. The first images are obtained at very low exposures and show the high performance of the system. The authors also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. They believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging

Published in:

Nuclear Science Symposium, 1997. IEEE  (Volume:2 )

Date of Conference:

9-15 Nov 1997