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In this paper, we present a simulation study of analog circuit performance parameters for a symmetric double-gate junctionless transistor (DGJLT) using dual-material gate along with high- k spacer dielectric (DMG-SP) on both sides of the gate oxides of the device. The characteristics are demonstrated and compared with DMG DGJLT and single-material (conventional) gate (SMG) DGJLT. The DMG DGJLT presents superior transconductance (Gm), early voltage (VEA), and intrinsic gain (GmRO) compared with SMG DGJLT. The values are further improved for DMG-SP DGJLT, because high- k spacer enhances the fringing electric fields through the spacer.