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Lumped-element sections for modeling coupling between high-speed digital and I/O lines

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7 Author(s)
Cui, W. ; Electromagnetic Compatibility Lab., Missouri Univ., Rolla, MO, USA ; Shi, H. ; Luo, X. ; Sha, F.
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Lumped-element sections are used for modeling coupling between high-speed digital and I/O lines on printed circuit boards (PCBs) in this paper. Radiated electromagnetic interference (EMI) is investigated when the I/O line going off the board is driven as an unintentional, but effective antenna. Simulated results are compared with measurements for coupled lines. A suitable number of lumped-element sections for modeling is chosen based on the line length and the highest frequency of interest

Published in:

Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on

Date of Conference:

18-22 Aug 1997

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