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The Dependence Of Ramp Rate On Breakdown Voltage And The Relation Of Breakdown Charge Density To Breakdown Field For Voltage Ramp Testing Of Oxides For Various Companies

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2 Author(s)
Tanner, D.M. ; Sandia National Laboratories ; Messick, C.

First Page of the Article

Published in:
Integrated Reliability Workshop Final Report, 1993 International

Date of Conference: 24-27 Oct 1993

Page(s):
227 - 229
Digital Object Identifier :
10.1109/IRWS.1993.666321
Product Type:
Conference Publications

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