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A unified approach for a time-domain built-in self-test technique and fault detection

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3 Author(s)
Provost, B. ; Dept. of Electr. Eng., Texas A&M Univ., TX, USA ; Brosa, A.M. ; Sánchez-Sinencio, E.

Being able to fully test a circuit is an important issue for quality manufacturing. Unlike fault analysis for digital circuits, analog fault analysis has been comparatively slow to evolve. The purpose of this paper is to study the feasibility of the time domain response analysis as a test method for analog circuits. The approach was to first study the fault coverage obtained by testing the main parameters of the new NGCC amplifier, which shows the feasibility of built-in self test in time-domain. A circuit macromodel to implement a time-domain built-in self-test circuit was then proposed

Published in:

VLSI, 1998. Proceedings of the 8th Great Lakes Symposium on

Date of Conference:

19-21 Feb 1998