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Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer

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5 Author(s)
Awny, A. ; Dept. of High-Freq. Electron., Univ. of Paderborn, Paderborn, Germany ; Moeller, L. ; Junio, J. ; Scheytt, J.C.
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A millimeter wave frequency mixed-signal design of a 1-tap half-rate look-ahead decision feedback equalizer for 80 Gb/s short-reach optical communication systems is presented. On-wafer tests are developed to determine the maximum operating bit rate of the equalizer. Results are also presented for intersymbol interference mitigation at 80 Gb/s for a 20 GHz bandwidth-limited channel. Further improvements on the architecture of the 80 Gb/s equalizer are discussed and used in the design and on-wafer measurement of a 110 Gb/s equalizer. The equalizers are designed in a 0.13 μm SiGe:C BiCMOS technology. The 80 and 110 Gb/s versions dissipate 4 and 5.75 W, respectively and occupy 2 and 2.56 mm2, respectively.

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Solid-State Circuits, IEEE Journal of  (Volume:49 ,  Issue: 2 )