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Microcracks at the device level in bulk solar cells are the current subject of substantial research by the photovoltaic (PV) industry. This review paper addresses nondestructive testing techniques that are used to detect microfacial and subfacial cracks. In this paper, we mainly focused on mono- and polycrystalline silicon PV devices and the root causes of the cracks in solar cells are described. We have categorized these cracks based on size and location in the wafer. The impact of the microcracks on electrical and mechanical performance of silicon solar cells is reviewed. For the first time, we have used the multi-attribute decision-making method to evaluate the different inspection tools that are available on the market. The decision-making tool is based on the analytical hierarchy process and our approach enables the ranking of the inspection tools for PV production stages, which have conflicting objectives and multi-attribute constraints.