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Determination of Excess Carrier Lifetimes in Silicon-On-Insulator Wafers by a Contactless Optical Technique

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2 Author(s)
Yang, P.C. ; Department of Electrical Engineering, University of Florida ; Li, Sheng S.

First Page of the Article

Published in:

SOI Conference, 1992. IEEE International

Date of Conference:

6-8 Oct. 1992