By Topic

Analyzing and improving reliability: a tree-based approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tian, J. ; Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA ; Palma, J.

Tree-based reliability models integrate the benefits of software reliability growth models and input domain reliability models, offering a framework to assess reliability and guidance to improve it. The authors studied five large systems to test their approach

Published in:

Software, IEEE  (Volume:15 ,  Issue: 2 )