Cart (Loading....) | Create Account
Close category search window

A multi-shank silk-backed parylene neural probe for reliable chronic recording

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Fan Wu ; Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA ; Lee Tien ; Fujun Chen ; Kaplan, D.
more authors

Many chronic brain implants would benefit from a neural probe with many densely configured electrodes with stable recording quality. We present a novel strategy to scale up the number of electrodes with minimized risk of proportionally increasing the adverse foreign body reactions. A flexible parylene probe having 64 electrodes has been designed and fabricated with unique geometries for reduced tissue reactions. Biocompatible silk fibroin was patterned to provide a biodegradable mechanical support of the flexible probe during insertion. We validated the design with in vivo recording in rats and observed no significant deterioration in recording quality for over 5 weeks.

Published in:

Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on

Date of Conference:

16-20 June 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.