Close category search window
 

Determination of active-region leakage currents in ridge-waveguide strained-layer quantum-well lasers by varying the ridge width

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Letal, G.J. ; Dept. of Eng. Phys., McMaster Univ., Hamilton, Ont., Canada ; Simmons, J.G. ; Evans, J.D. ; Li, G.P.

This paper is concerned with the investigation of lateral current spreading in InGaAsP strained-layer, ridge-waveguide multiple-quantum-well (MQW) semiconductor lasers consisting of nine quantum wells (QWs) and having ridge widths varying from 1.5 to 5 μm. By using a simple analytical model, it is possible to demonstrate that as much as 60% of the injected current escapes out of the active region of a 1.5-μm laser at threshold. For the first time, such an analysis is extended into the above-threshold regime to examine the effects of lateral current spreading on the external differential efficiency

Published in:
Quantum Electronics, IEEE Journal of  (Volume:34 ,  Issue: 3 )

Date of Publication: Mar 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.