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Dynamic fault dictionaries and two-stage fault isolation

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2 Author(s)
Ryan, P.G. ; Intel Corp., Santa Clara, CA, USA ; Fuchs, W.K.

This paper presents dynamic two stage fault isolation for sequential random logic VLSI circuits, and introduces limited and dynamic fault dictionaries. In the first stage of the dynamic process, a limited fault dictionary identifies candidate faults, which are further distinguished in the second stage by a dictionary generated dynamically for the candidate faults and a subset of the test vectors. This provides high resolution but avoids the costs of full static dictionaries. Two-stage fault isolation is evaluated for benchmark circuits and on defects in industrial circuits.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:6 ,  Issue: 1 )

Date of Publication:

March 1998

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