Cart (Loading....) | Create Account
Close category search window
 

Maximum power estimation for CMOS circuits using deterministic and statistical approaches

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wang, C.-Y. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Roy, K.

Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to efficiently obtain a precise estimation of the maximum power dissipation. However, due to the inherent input-pattern dependence of the problem, it is impractical to conduct an exhaustive search for circuits with a large number of primary inputs. Hence, the practical approach is to generate a tight lower bound and an upper bound for maximum power dissipation within a reasonable amount of central processing unit (CPU) time. In this paper, instead of using the traditional simulation-based techniques, we propose a novel approach to obtain a lower bound of the maximum power consumption using automatic test generation (ATG) technique, Experiments with MCNC and ISCAS-85 benchmark circuits show that our approach generates the lower bound with the quality which cannot be achieved using simulation-based techniques. In addition, a Monte Carlo-based technique to estimate maximum power dissipation is described. It not only serves as a comparison version for our ATG approach, but also generates a metric to measure the quality of a lower bound from a statistical point of view.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:6 ,  Issue: 1 )

Date of Publication:

March 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.