Electro-optic near-field mapping of planar resonators

A comprehensive experimental and theoretical study for the determination of the electric near-field above planar resonators is presented. The transverse component of the electric field is mapped by external electro-optic (EO) sampling technique with high spatial and temporal resolution. The evolution of the near-field radiation pattern of the investigated 7-GHz planar resonator to the onset of the far-field pattern is traced by measurements at various heights above the sample. Frequency-dependent measurements allow to characterize the field pattern changes when the frequency is swept through the main resonance. Additional undesired resonances are identified by the detected mode pattern. The experimental data are reproduced by simulations based upon an electric field integral equation (EFIE) method.