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Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL

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5 Author(s)
Khan, N.A. ; Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK ; Schires, K. ; Hurtado, A. ; Henning, I.D.
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In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20°C to 60°C. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.

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Quantum Electronics, IEEE Journal of  (Volume:49 ,  Issue: 11 )