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Random pattern testability of memory control logic

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1 Author(s)
Savir, J. ; Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA

This paper analyzes the random pattern testability of faults in the control logic of an embedded memory. We show how to compute exposure probabilities of these faults using mostly signal probability computations. We also show that the hardest memory control logic fault to detect is not necessarily the one with the lowest detection probability at the memory boundary

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Computers, IEEE Transactions on  (Volume:47 ,  Issue: 3 )