Referenced Items are not available for this document.
It is noted that an important problem associated with analog and mixed analog/digital VLSI design has been the lack of a systematic approach to the design and testing of such integrated systems. The authors describe a computer environment that brings the different design aspects closely together. It has been used successfully to analyze the performance of high-speed flash analog/digital converters. Interaction among simulations, CAD (computer-aided design) tools, measurements, and testing is provided for in this approach
Published in:
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Date of Conference: 13-15 Feb 1990
- Page(s):
- 232 - 235
- Meeting Date :
- 13 Feb 1990-15 Feb 1990
- INSPEC Accession Number:
- 3742168
- Conference Location :
- San Jose, CA
- Digital Object Identifier :
- 10.1109/IMTC.1990.66005
- Product Type:
- Conference Publications
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