Cart (Loading....) | Create Account
Close category search window
 

A robust six-to-four port reduction technique for the calibration of six-port microwave network analysers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wright, A.S. ; Dept. of Electron. Eng., Hull Univ., UK ; Judah, S.K.

The authors introduce a simple method by which the robust calibration technique developed by S.K. Judah (1985) may be unified with the thru-reflect-line technique, yielding initial estimates of the six-port instrumental parameters that are insensitive to noise and random errors. This calibration technique has been employed in a single six-port reflectometer operating at 2 GHz. Experimental experience has shown the technique to be robust; problems encountered using the method recommended by G.F. Engen (1979) have not arisen. Investigation by computer simulation has also shown the technique to be reliable. This methodology requires a substantial increase in software effort owing to the effective operational requirement of two full calibration techniques

Published in:

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Date of Conference:

13-15 Feb 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.