By Topic

An algorithm for diagnostics with signature analyzer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
J. C. Chan ; IBM Corp., Austin, TX, USA ; B. F. Womack

An algorithm for fault diagnosis that makes use of the information from a faulty signature is presented. The idea is to search the likely error locations before the tests are performed. The method reduces the number of tests required to diagnose the errors with the probability of aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred. Also, the case of `don't cares' at the input sequence of signature analysis is discussed. The algorithm can be readily implemented in software with the faulty signature as the only input variable. The proposed fault diagnostic scheme has an advantage over exhaustive testing in that it leads to fault isolation in a homing-in manner

Published in:

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Date of Conference:

13-15 Feb 1990