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Data-driven self-timed RSFQ high-speed test system

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4 Author(s)
Z. J. Deng ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; N. Yoshikawa ; S. R. Whiteley ; T. Van Duzer

Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits.

Published in:

IEEE Transactions on Applied Superconductivity  (Volume:7 ,  Issue: 4 )