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Low energy proton induced SEE in memories

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7 Author(s)
S. Duzellier ; ONERA-CERT, Toulouse, France ; R. Ecoffet ; D. Falguere ; T. Nuns
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This paper presents proton sensitivity curves obtained on memories from various generations. Highlight is set on component response at very low energy (down to 5 MeV) and implications on the calculated SEE rates are discussed

Published in:

IEEE Transactions on Nuclear Science  (Volume:44 ,  Issue: 6 )