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Determination of low energy (<160 keV) X-ray spectra and verification of transport calculations through silicon

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6 Author(s)
Turinetti, J.R. ; Phillips Lab., Kirtland AFB, NM, USA ; Critchfield, K.L. ; Chavez, J.R. ; Kemp, W.T.
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X-ray spectroscopy discrepancies at measured energies below 50 keV are shown through ITS detector response calculations to be caused by germanium K edge escape peak losses. Accounting for this detector response, CEPXS/ONELD transport calculations through silicon agree well with measurements

Published in:

Nuclear Science, IEEE Transactions on  (Volume:44 ,  Issue: 6 )

Date of Publication:

Dec 1997

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