By Topic

Vector Network Analyzer Calibration Using a Line and Two Offset Reflecting Loads

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Pulido-Gaytan, M.A. ; Center for Sci. Res. & Higher Educ. at Ensenada (CICESE), Ensenada, Mexico ; Reynoso-Hernandez, J.A. ; Zarate-de Landa, A. ; Loo-Yau, J.R.
more authors

In this paper, the line-offset offset-open offset-short (LZZ) calibration technique for vector network analyzers (VNA) is introduced. The LZZ uses as calibration standards a fully known transmission line and two offset reflecting loads. The mathematical formulation of the LZZ is based on the use of ABCD-parameters for modeling the imperfect VNA as well as calibration standards. As a result, it is shown that the error coefficients characterizing the imperfect VNA can be calculated by comparing the estimated impedance of the two loads with the characteristic impedance of the transmission line. In order to validate the proposed method, the line-reflect-line (LRL) and the line-reflect-reflect-match (LRRM) calibration techniques are used. A high correlation between the S-parameters of a heterostructure field-effect transistor corrected with the LRL, LRRM, and LZZ techniques up to 45 GHz is achieved.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:61 ,  Issue: 9 )