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NBTI/PBTI-Aware WWL Voltage Control for Half-Selected Cell Stability Improvement

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4 Author(s)
Chuan Zhao Lee ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Kam Chew Leong ; Zhi Hui Kong ; Kim, T.T.-H.

This brief presents a negative bias temperature instability (BTI)/positive BTI-aware write-wordline (WWL) voltage control technique for improving degraded cell stability of half-selected cells without extra power consumption. After BTI aging, the proposed lowering WWL voltage recovers the degraded cell stability without scarifying the write margin. Finally, we also present a sample circuit implementation of the proposed WWL voltage control scheme.

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Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:60 ,  Issue: 9 )