Cart (Loading....) | Create Account
Close category search window
 

A new technique to monitor the electrode and lead failures in implantable microstimulators and sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Arabi, K. ; Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada ; Kaminska, B.

The electrodes and wire lead failures are the main reasons of implantable system malfunction. The impedance change and fibrosis of the living tissue which is in contact with the electrode are also important parameters to monitor. Measuring the resistance of leads, electrode-tissue contact and the interelectrode tissue can be used to test the functionality of implanted electrodes and to deduce the state of the interelectrode tissue. This paper describes the feasibility of using an oscillator, the frequency of which is controlled by the above mentioned resistance, to test the electrode functionally as well as the state of the living tissue. The oscillation frequency is a digital signal which can be easily evaluated by the implant or the external controller. It is shown that this approach results in a very low-cost and practical solution. The oscillator has been designed using CMOS 1.2 μm technology parameters. This technique can be implemented in any implantable system to increase its reliability

Published in:

Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE  (Volume:1 )

Date of Conference:

31 Oct-3 Nov 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.