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Visualizing graphene edges using tip-enhanced Raman spectroscopy

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2 Author(s)
Su, Weitao ; Institute of Materials Physics, Hangzhou Dianzi University, 310018, Hangzhou, China ; Roy, Debdulal

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The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This article presents an image of graphene edges using high resolution tip-enhanced Raman spectroscopy (TERS) of mechanically exfoliated SLG and reports the value of Lσ (4.2 ± 0.5 nm). The current near-field measurements verify the theoretical value of Lσ and highlight the potential of TERS in characterizing graphene at the nanoscale.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:31 ,  Issue: 4 )