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Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration

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3 Author(s)
Ruifeng Guo ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Pomeranz, I. ; Reddy, S.M.

We propose several compaction procedures for synchronous sequential circuits based on test vector restoration. Under a vector restoration procedure, all or most of the test vectors are first omitted from the test sequence. Test vectors are then restored one at a time or in subsequences only as necessary to restore the fault coverage of the original sequence. Techniques to speed-up the restoration process are investigated. These include limiting the test vectors initially omitted from the test sequence, consideration of several faults in parallel during restoration, and the use of a parallel fault simulator

Published in:

Design, Automation and Test in Europe, 1998., Proceedings

Date of Conference:

23-26 Feb 1998