Cart (Loading....) | Create Account
Close category search window
 

Formal Guarantees for Localized Bug Fixes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Mitra, S. ; Dept. of Comput. Sci. & Eng., IIT Kharagpur, Kharagpur, India ; Banerjee, A. ; Dasgupta, P. ; Ghosh, P.
more authors

Bug traces produced in simulation serve as the basis for patching the RTL code in order to fix a bug. It is important to prove that the patch covers all instances of the bug scenario; otherwise, the bug may return with a different valuation of the variables involved in the bug scenario. For large circuits, formal methods do not scale well enough to comprehensively eliminate the bug, and achieving adequate coverage in simulation and regression testing becomes expensive. This paper proposes formal methods for analyzing the control trace leading to the observed manifestation of the bug and verifying the robustness of the bug fix with respect to that control trace. We propose a classification of the bug fix based on the guarantee that our analysis can provide about the quality of the bug fix. Our method also prescribes the types of tests that are recommended to validate the bug fix on other types of scenarios. Since our methods are more scalable by orders of magnitude than model checking the entire design, we believe that the proposed formal methods hold immense promise in analyzing bug fixes in practice.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:32 ,  Issue: 8 )

Date of Publication:

Aug. 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.