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Angular memory and frequency interferometry for mean height profiling of a rough surface

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4 Author(s)
Le, C.T.C. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Ishimaru, A. ; Kuga, Y. ; Yea, J.-H.

The polarimetric angular memory effect is applied to obtain the average topographic height of a rough surface. This novel effect improves the height sensitivity while maintaining a good degree of correlation between the sensors. By using a reference flat surface, the interferometric phase is linearly related to the mean topographic height. The combination of angular memory and wideband frequency interferometry (AMFI) is realized and offers a means to design a robust interferometric system. Extension of the technique to the pulse scattering problem is studied through the two-frequency mutual coherence function, and its time-domain transform provides an equivalent way to obtain the mean topographic height by combining both spatial and temporal diversity. Millimeter-wave (MMW) experiments are conducted with rough surfaces of different statistics and scattering media of different types (gravel, sand, and rough surfaces) to prove the effectiveness of the technique

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:36 ,  Issue: 1 )

Date of Publication:

Jan 1998

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